Field Emission Scanning Electron Microscope (FESEM) facility

FESEM is the latest addition to the SAIF at Manipal University Jaipur. The JEOL make JSM-7610FPlus FESEM at SAIF is an ultra-high-resolution electron microscope which has semi-in-lens detectors and an in-the-lens Schottky field emission gun. The instrument can deliver high resolution with wide range of probe currents which facilitates observation of extremely fine structures for all kind of samples including the biological samples. The JSM-7610F chamber is fitted with EDAX Energy Dispersive X-ray (EDS) detector for elemental analysis at the micro-nanoscale. Thus the machine is suitable for almost all kind of applications viz. nanotechnology, material science, biology, compositional and structural analysis.

Salient Features

• High spatial resolution (1 kV 1.0 nm, 15 kV 0.8 nm)
• High probe current for analytical purposes like EDS
• High power optics to ensure small probe diameter even with large probe current
• Gentle Beam mode to reduce the landing voltage of the electrons suitable for top-surface imaging, reduced beam damage and charge suppression
• Energy filtered imaging to freely select between secondary electrons and backscattered electrons
• Eucentric specimen stage to rotate, tilt and shift the specimen with minimal focus deviation

FESEM Sample Preparation

The facility has the following instruments to process and prepare various samples for FESEM characterisation

• Compact and automatic rotary pumped sputter coater for gold/platinum/carbon coating of the non- conducting samples.
• Buehler  IsoMet low speed  precision sample cutter for cutting various types of materials including brittle or ductile metals, composites, cements, laminates, plastics, electronic devices and biomaterials with minimal deformation
•  Buehler EcoMet 30 grinder and polisher for processing advanced materials e.g., metals, glass, ceramics, polymers, rubbers and composites

X-ray Diffraction (XRD) Facility

The Rigaku make automated multipurpose X-ray Diffractometer (model: SMARTLAB) has the provision for advance material research on powders, thin films, and bulk solids of polycrystalline, nano-crystalline and amorphous nature.

The XRD system must has the capability to configure in different modes like

• High resolution powder, polycrystalline, thin film X-Ray Diffraction
• Grazing Incidence X-Ray Diffraction (GIXRD)
• In-plane Diffraction with a horizontal sample mounting
• Residual Stress and Texture (Pole figure)
• Non-ambient analysis for phase transition study
• X-ray reflectometry (XRR), Rocking curve
• Small-angle X-ray scattering (SAXS)

SAIF Occupancy Calendar

• Click Here for checking the instrument occupancies.

Office Address

The SAIF is housed in Room No-017,

Ground Floor, Academic Block 2,

Manipal University Jaipur

Email:  motikumar.jha@jaipur.manipal.edu, analyticalfacility@gmail.com

Tel: +91-1413999100, Ext.323

Contact Us 

Dr. Nilanjan Halder

Associate Professor | Department of Physics

Manipal University Jaipur

Dehmi Kalan | Jaipur-303007 | Rajasthan | India

Tel: +91-141- 3999100, Ext: 208

Mob:+91-9783784795

Email: nilanjan.halder@jaipur.manipal.edu